SN74ABT8543DL Подобна

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT8543DL Datasheet и Spec

Производител : TI

Опаковка : DL

Pins : 28

Температурата : Мин -40 °C | Макс 85 °C

Размер : 392 KB

Заявление : SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS