SN74LVTH16652DLR Подобна

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    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
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  • SN74AHC541PWR
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    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74LVTH16652DLR Datasheet и Spec

Производител : TI 

Опаковка : DL 

Pins : 56 

Температурата : Мин -40 °C | Макс 85 °C

Размер : 172 KB

Заявление : 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS 

SN74LVTH16652DLR PDF Изтегли

SN74LVTH16652DLR PDF