SN74ABT377ADBLE Подобна

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT377ADBLE Datasheet и Spec

Производител : TI

Опаковка : DB

Pins : 20

Температурата : Мин -40 °C | Макс 85 °C

Размер : 118 KB

Заявление : OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE